- Fully customizable systems that can include:
- Configurations that range from bench-top to full-height racks of instrumentation
- Wafer level and cassette level automation
- Compatibility with popular semi- and fully-automatic wafer probers
- Test setup tightly integrated with wafer setup
- Interactive prober control for setup and analysis
- Binning and wafer mapping
- Interactive graphical results displayed at both test setup and cassette level review
- Configurable, real time results plotted during automation
- Report generation and summary tool
- Integrated test script development tools