HP Agilent N5397A FPGA Dynamic Probe Option
HP Agilent N5397A FPGA Dynamic Probe Option for Xilinx with Infiniium Series MSOs
View internal FPGA activity correlated to external analog events
- Gain visibility into your Xlinx FPGA's internal activity.
- Access up to 64 internal signals for each pin dedicated to debug
- Watch a 6 min Video overview
Make multiple measurements in seconds
- Switch internal probe points in seconds. Moving probe points internal to an FPGA is time consuming on instruments without this capability. Now, in less than a second you can easily measure a different set of internal signals without changing your FPGA design.
Leverage the work you did in your design environment
- Automatic mapping of internal signal names to MSO labels leverages the work you did in your design environment.
Requirements
- 9000 Series Infiniium Oscilloscopes
- Supports Virtex-5 series, Virtex-4 series, Virtex-II Pro series, Virtex-II series, and Spartan-3 series devices.
- Requires Xilinx ChipScope Pro or Embedded Development Kit (EDK)

